Home > Term: Atomic force microscopy (AFM)
Atomic force microscopy (AFM)
A very high-resolution type of scanning microscopy with resolution of fractions of a nanometer (one nanometer = one billionth of a meter); also called "scanning force microscopy (SFM)".
- Jenis Kata: noun
- Industri / Domain: Lingkungan alamiah
- Kategori: Terumbu karang
- Organization: NOAA
0
Penulis
- Harry8L
-
(V.I.P) 574128 poin - 100% positive feedback
(London, United Kingdom)
